Materials & Industrial Analysis
X-ray analytical systems and elemental analysis for research and industrial materials characterisation.
Bruker
18 productsBenchtop X-ray fluorescence (XRF) spectrometer for elemental analysis.
View details →High-power wavelength-dispersive XRF spectrometer.
View details →Multi-purpose X-ray diffractometer for materials research.
View details →Compact benchtop X-ray diffractometer for phase identification and quantitative analysis.
View details →Industrial X-ray diffractometer for cement, mining and process laboratories.
View details →High-throughput wavelength-dispersive XRF spectrometer for cement, minerals and metals.
View details →Simultaneous WDXRF spectrometer for on-line process elemental analysis.
View details →Benchtop energy-dispersive XRF spectrometer for elemental analysis.
View details →On-line XRF analyser for real-time elemental analysis of conveyed materials.
View details →Compact spark-OES metal analyser for foundries and small metalworking shops.
View details →Advanced CCD spark-OES spectrometer for metals analysis across the periodic table.
View details →High-end spark-OES spectrometer for demanding metals analysis and R&D.
View details →Fully-configurable single-crystal X-ray diffraction platform for small-molecule crystallography.
View details →High-performance SC-XRD system for chemical and macromolecular crystallography.
View details →Silicon drift detector (SDD) EDS systems for scanning electron microscopy.
View details →Electron Backscatter Diffraction system for crystallographic orientation mapping.
View details →Micro-X-ray fluorescence spectrometer for spatially-resolved elemental analysis.
View details →High-resolution X-ray micro-computed tomography for 3D structural imaging.
View details →