There is a wide range of X-ray scattering techniques for characterisation and quality control of crystalline or non-crystalline materials such as powders, solid blocks, thin films or liquids. Techniques include X-ray powder diffraction (XRPD), diffuse or 'total' scattering (PDF analysis), small-angle X-ray scattering (SAXS) and thin-film analysis.
Unique platform designs allow systems to be configured from core, well-tested and high-performance components — tailoring the system to the application. In research environments, particularly where educational demands broaden the range of applications needed, a high priority is having a system that can be reconfigured with minimum disruption and maximum security.