Compositional and structural analysis is enabled on Scanning and Transmission Electron Microscopy (SEM/TEM) through a powerful range of systems for energy-dispersive (EDS) and wavelength-dispersive (WDS) X-ray spectrometry, electron backscatter diffraction analysis (EBSD), as well as micro-X-ray fluorescence and micro-computed-tomography (CT) designed for the electron microscope.
Compositional & Structural Analysis in Electron Microscopy
EDS, WDS, EBSD, micro-XRF and micro-CT systems for SEM and TEM electron microscopes.